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[In-person]Advanced TRL Method for Differential Devices
Advanced TRL Method for Differential Devices
ID：32
Submission ID：27 View Protection：ATTENDEE
Updated Time：2025-11-19 09:19:54 Hits：368
In-person
Start Time：2025-12-29 15:00 （Asia/Amman）
Duration：15min
Session：[S1] Track 1: Mobile computing, communications, 5G and beyond » [S1-1] Track 1: Mobile computing, communications, 5G and beyond
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Abstract
Accurate calibration of Vector Network Analyzers (VNAs) remains a keystone for high-reliability characterization of RF and microwave devices, especially when dealing with embedded differential structures. This paper presents an advanced TRL (Thru-Reflect-Line) calibration technique precisely designed for devices with differential input and single-ended output integrated into measurement boards. The proposed method builds upon a previously introduced TRL framework tailored for two-port devices and extends its applicability to asymmetric three-port configurations using simulated or on-wafer characterized standards. Through a three-step calibration process involving sequential TRL setups and an impedance bridging scheme, all elements of the Z-parameter matrix—including the otherwise inaccessible Z21—are successfully extracted. Comprehensive simulations using Agilent ADS validate the effectiveness and robustness of the proposed technique. The outcomes confirm that this approach provides a scalable and accurate methodology for embedded system characterization, especially in scenarios where conventional calibration kits fall short due to size and layout constraints.
Keywords
Calibration,TRL,Differential,Test board,DUT
Speaker
Ali Rachini
Assistant Professor Holy Spirit University of KaslikSubmission Author
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